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[IEEE 2010 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Chengdu, China (2010.05.8-2010.05.11)] 2010 International Conference on Microwave and Millimeter Wave Technology - Characterization of high-frequency noise performance of GaN double heterojunction HEMT

✍ Scribed by Xu, Yuehang; Guo, Yunchuan; Wu, Yunqiu; Xu, Ruimin; Yan, Bo

Book ID: 115526330
Publisher: IEEE
Year: 2010
Weight: 106 KB
Volume: 0
Category: Article
ISBN: 142445705X
DOI: 10.1109/icmmt.2010.5524841

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