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[IEEE 2010 International Conference on Machine Learning and Applications (ICMLA) - Washington, DC, USA (2010.12.12-2010.12.14)] 2010 Ninth International Conference on Machine Learning and Applications - A Comparative Study of Ensemble Feature Selection Techniques for Software Defect Prediction

✍ Scribed by Wang, Huanjing; Khoshgoftaar, Taghi M.; Napolitano, Amri

Book ID: 115460563
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 175 KB
Volume: 0
Category: Article
ISBN: 1424492114
DOI: 10.1109/icmla.2010.27

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