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[IEEE 2010 International Conference on Electronics and Information Engineering (ICEIE 2010) - Kyoto, Japan (2010.08.1-2010.08.3)] 2010 International Conference on Electronics and Information Engineering - Characterization of planar microstrip discontinuities

✍ Scribed by Oueslati, Nejla; Aguili, Taoufik

Book ID: 125847076
Publisher: IEEE
Year: 2010
Weight: 711 KB
Category: Article
ISBN: 1424476798
DOI: 10.1109/ICEIE.2010.5559720

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