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[IEEE 2010 International Conference on Electronic Devices, Systems and Applications (ICEDSA) - Kuala Lumpur, Malaysia (2010.04.11-2010.04.14)] 2010 International Conference on Electronic Devices, Systems and Applications - Improvement of noise tolerance analysis in deep-submicron low voltage dynamic CMOS logic circuits

✍ Scribed by Pattanaik, Manisha; Khan, Fazal Rahim; Varaprasad, Muddala V. D. L.

Book ID: 126631844
Publisher: IEEE
Year: 2010
Weight: 438 KB
Category: Article
ISBN: 1424466296
DOI: 10.1109/ICEDSA.2010.5503105

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