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[IEEE 2010 International Conference on Electrical and Control Engineering (ICECE) - Wuhan, China (2010.06.25-2010.06.27)] 2010 International Conference on Electrical and Control Engineering - The Simulation Breakdown Characteristic of 4H-SiC SBD with Field Rings

✍ Scribed by Zhang, Fasheng; Li, Xinran

Book ID: 111923429
Publisher: IEEE
Year: 2010
Weight: 815 KB
Volume: 0
Category: Article
ISBN: 1424468809
DOI: 10.1109/icece.2010.760

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