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[IEEE 2010 International Conference on Computer Design and Applications (ICCDA 2010) - Qinhuangdao, China (2010.06.25-2010.06.27)] 2010 International Conference On Computer Design and Applications - Nanometer bulk-driven applications MOSFET model analysis

✍ Scribed by Wang Shaoxi,

Book ID: 120078245
Publisher: IEEE
Year: 2010
Weight: 940 KB
Category: Article
ISBN: 1424471648
DOI: 10.1109/ICCDA.2010.5541217

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