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[IEEE 2010 International Conference on Computational Intelligence and Software Engineering (CiSE) - Wuhan, China (2010.12.10-2010.12.12)] 2010 International Conference on Computational Intelligence and Software Engineering - Application of Rotating Machinery Fault Diagnosis System Based on Improved WNN

✍ Scribed by Zhang, Huawei; Pan, Hao

Book ID: 121474115
Publisher: IEEE
Year: 2010
Weight: 254 KB
Category: Article
ISBN: 1424453917
DOI: 10.1109/CISE.2010.5677011

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