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[IEEE 2010 International Conference on Biomedical Engineering and Computer Science (ICBECS) - Wuhan, China (2010.04.23-2010.04.25)] 2010 International Conference on Biomedical Engineering and Computer Science - Research on Reliability Improvement of NAND Flash Memory in FAT File System

✍ Scribed by Zhang, Juntao; Yao, Kun

Book ID: 120055258
Publisher: IEEE
Year: 2010
Weight: 296 KB
Category: Article
ISBN: 1424453151
DOI: 10.1109/ICBECS.2010.5462383

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