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[IEEE 2010 International Conference on Availability, Reliability, and Security (ARES) - Krakow, Poland (2010.02.15-2010.02.18)] 2010 International Conference on Availability, Reliability and Security - Measuring the Level of Security Introduced by Security Patterns

✍ Scribed by Fernandez, Eduardo B.; Yoshioka, Nobukazu; Washizaki, Hironori; VanHilst, Michael

Book ID: 121231409
Publisher: IEEE
Year: 2010
Weight: 551 KB
Category: Article
ISBN: 142445879X
DOI: 10.1109/ARES.2010.111

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