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[IEEE 2010 International Conference on Actual Problems of Electron Devices Engineering (APEDE 2010) - Saratov (2010.09.22-2010.09.23)] 2010 International Conference on Actual Problems of Electron Devices Engineering - The interface of measuring system on the basis of the single-element thermal receiver with the thermosensitive layer of film VO2

✍ Scribed by Oleynik, A S; Maslov, D M

Book ID: 115447156
Publisher: IEEE
Year: 2010
Weight: 107 KB
Volume: 0
Category: Article
ISBN: 1424469546
DOI: 10.1109/apede.2010.5624085

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