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[IEEE 2010 International Conference of Information Science and Management Engineering - Shaanxi, China (2010.08.7-2010.08.8)] 2010 International Conference of Information Science and Management Engineering - A Novel Robust Contour Tracking Algorithm

✍ Scribed by Xu, Jianjun; Bi, Duyan; Wei, Zifu

Book ID: 118221365
Publisher: IEEE
Year: 2010
Weight: 525 KB
Volume: 0
Category: Article
ISBN: 1424476690
DOI: 10.1109/isme.2010.96

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