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[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Conductor profile effects on the propagation constant of microstrip transmission lines

✍ Scribed by Horn, Allen F.; Reynolds, John W.; Rautio, James C

No coin nor oath required. For personal study only.

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