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[IEEE 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) - Montreal, QC, Canada (2010.07.6-2010.07.9)] 2010 IEEE/ASME International Conference on Advanced Intelligent Mechatronics - Development in Mechatronics — Enhancing reliability by means of a sustainable use of information

✍ Scribed by Hofmann, Daniel; Kopp, Michael; Bertsche, Bernd

Book ID: 120605562
Publisher: IEEE
Year: 2010
Weight: 164 KB
Category: Article
ISBN: 1424480310
DOI: 10.1109/AIM.2010.5695892

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