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[IEEE 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2010.11.7-2010.11.11)] 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Design and manufacturing of organic RFID circuits: Coping with intrinsic parameter variations in organic devices by circuit design

✍ Scribed by Genoe, Jan; Myny, Kris; Steudel, Soeren; Heremans, Paul

Book ID: 115473805
Publisher: IEEE
Year: 2010
Weight: 1007 KB
Volume: 0
Category: Article
ISBN: 1424481937
DOI: 10.1109/iccad.2010.5653782

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