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[IEEE 2010 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2010.06.16-2010.06.18)] 2010 Symposium on VLSI Circuits - 2.4GHz 7mW all-digital PVT-variation tolerant True Random Number Generator in 45nm CMOS

✍ Scribed by Srinivasan, Suresh; Mathew, Sanu; Ramanarayanan, Rajaraman; Sheikh, Farhana; Anders, Mark; Kaul, Himanshu; Erraguntla, Vasantha; Krishnamurthy, Ram; Taylor, Greg

Book ID: 121326496
Publisher: IEEE
Year: 2010
Weight: 602 KB
Category: Article
ISBN: 1424454549
DOI: 10.1109/VLSIC.2010.5560296

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