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[IEEE 2010 IEEE Symposium on Security and Privacy - Oakland, CA, USA (2010.05.16-2010.05.19)] 2010 IEEE Symposium on Security and Privacy - State of the Art: Automated Black-Box Web Application Vulnerability Testing

โœ Scribed by Bau, Jason; Bursztein, Elie; Gupta, Divij; Mitchell, John


Book ID
121235666
Publisher
IEEE
Year
2010
Weight
349 KB
Category
Article
ISBN
1424468949

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