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[IEEE 2010 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2010.05.18-2010.05.20)] 2010 IEEE International Vacuum Electronics Conference (IVEC) - P4-18: Cold testing platform for Electromagnetic Band Gap waveguide

✍ Scribed by Bai, Ningfeng; Fan, Hehong; Zhao, Xingqun; Liao, Fujiang; Feng, Jinjun; Sun, Xiaohan

Book ID: 118006084
Publisher: IEEE
Year: 2010
Weight: 529 KB
Volume: 0
Category: Article
ISBN: 1424470986
DOI: 10.1109/ivelec.2010.5503467

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