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[IEEE 2010 IEEE International Symposium on Industrial Electronics (ISIE 2010) - Bari, Italy (2010.07.4-2010.07.7)] 2010 IEEE International Symposium on Industrial Electronics - A new approach to establish the thermal instability condition and the failure time during the drain current focusing process in a power MOSFET working in linear zone

✍ Scribed by Consentino, Giuseppe

Book ID: 115470911
Publisher: IEEE
Year: 2010
Weight: 784 KB
Volume: 0
Category: Article
ISBN: 1424463904
DOI: 10.1109/isie.2010.5637435

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