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[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Quantum-based SI traceable electric-field probe

โœ Scribed by Gordon, Joshua A; Holloway, Christopher L; Jefferts, Steve; Heavner, Tom


Book ID
126714620
Publisher
IEEE
Year
2010
Weight
524 KB
Category
Article
ISBN
142446305X

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