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[IEEE 2010 IEEE International Symposium on Electrical Insulation (ISEI) - San Diego, CA, USA (2010.06.6-2010.06.9)] 2010 IEEE International Symposium on Electrical Insulation - Comparison of partial discharge measurement and simulation results for spherical cavities within solid dielectric materials as a function of frequency using Finite Element Analysis method

✍ Scribed by Illia, H.A.; Chen, G.; Lewin, P.L.

Book ID: 121655969
Publisher: IEEE
Year: 2010
Weight: 839 KB
Category: Article
ISBN: 1424462983
DOI: 10.1109/ELINSL.2010.5549733

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