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[IEEE 2010 IEEE International Symposium on Electrical Insulation (ISEI) - San Diego, CA, USA (2010.06.6-2010.06.9)] 2010 IEEE International Symposium on Electrical Insulation - Do hipot tests damage rotating machine insulation?

✍ Scribed by Gupta, B.K.; Sedding, H.G.; Stone, G.C.; Stein, J.

Book ID: 115443728
Publisher: IEEE
Year: 2010
Weight: 220 KB
Volume: 0
Category: Article
ISBN: 1424462983
DOI: 10.1109/elinsl.2010.5549759

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