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[IEEE 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010 - Paris, France (2010.05.30-2010.06.2)] Proceedings of 2010 IEEE International Symposium on Circuits and Systems - Detection of inter-port bridging faults in dual-port memories

✍ Scribed by Choi, Ho-Yong; Saluja, Kewal K.

Book ID: 121183408
Publisher: IEEE
Year: 2010
Weight: 413 KB
Category: Article
ISBN: 1424453089
DOI: 10.1109/ISCAS.2010.5537500

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