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[IEEE 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Rotterdam, Netherlands (2010.04.14-2010.04.17)] 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Image registration based 3D TEE-EM calibration

✍ Scribed by Huang, Xishi; Gutierrez, Luis F.; Stanton, Douglas; Kim, Peter C.W.; Jain, Ameet

Book ID: 111923445
Publisher: IEEE
Year: 2010
Weight: 322 KB
Volume: 0
Category: Article
ISBN: 1424441250
DOI: 10.1109/isbi.2010.5490212

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