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[IEEE 2010 IEEE International Power Modulator and High Voltage Conference (IPMHVC) - Atlanta, GA, USA (2010.05.23-2010.05.27)] 2010 IEEE International Power Modulator and High Voltage Conference - Development of a high voltage, high frequency, fast dV/dt tester for the study of failure mechanisms in dielectric materials

โœ Scribed by Tao, Fengfeng; Yin, Weijun; Schweickart, Daniel


Book ID
115474634
Publisher
IEEE
Year
2010
Weight
746 KB
Volume
0
Category
Article
ISBN
1424471311

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