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[IEEE 2010 IEEE International Conference on RFID (IEEE RFID 2010) - Orlando, FL, USA (2010.04.14-2010.04.16)] 2010 IEEE International Conference on RFID (IEEE RFID 2010) - The “weak spots” in stacked UHF RFID tags in NFC applications

✍ Scribed by Xiaosheng Chen, ; Feng Lu, ; Ye, Terry T.

Book ID: 126597688
Publisher: IEEE
Year: 2010
Weight: 811 KB
Category: Article
ISBN: 1424457424
DOI: 10.1109/RFID.2010.5467262

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