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[IEEE 2010 IEEE International Conference on Management of Innovation & Technology - Singapore, Singapore (2010.06.2-2010.06.5)] 2010 IEEE International Conference on Management of Innovation & Technology - Cause-and-effect function analysis

✍ Scribed by Kim, Hongbin; Choi, Sungchul; Jeong, Cheolhyun; Kim, Kwangsoo

Book ID: 126754755
Publisher: IEEE
Year: 2010
Weight: 746 KB
Category: Article
ISBN: 1424465656
DOI: 10.1109/ICMIT.2010.5492765

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