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[IEEE 2010 IEEE International Conference on Electro/Information Technology (EIT 2010) - Normal, IL, USA (2010.05.20-2010.05.22)] 2010 IEEE International Conference on Electro/Information Technology - Development of a neural network based surface roughness prediction system using cutting parameters and an accelerometer in turning

✍ Scribed by Asilturk, Ilhan; Unuvar, Ali

Book ID: 126750564
Publisher: IEEE
Year: 2010
Weight: 327 KB
Category: Article
ISBN: 1424468736
DOI: 10.1109/EIT.2010.5612190

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