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[IEEE 2010 IEEE International Conference on Computer Design (ICCD 2010) - Amsterdam, Netherlands (2010.10.3-2010.10.6)] 2010 IEEE International Conference on Computer Design - Enhancing dual-Vt design with consideration of on-chip temperature variation

✍ Scribed by Gu, Junjun; Qu, Gang; Yuan, Lin

Book ID: 121211182
Publisher: IEEE
Year: 2010
Weight: 708 KB
Category: Article
ISBN: 1424489369
DOI: 10.1109/ICCD.2010.5647619

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