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[IEEE 2010 IEEE International Conference on Automation Science and Engineering (CASE 2010) - Toronto, ON (2010.08.21-2010.08.24)] 2010 IEEE International Conference on Automation Science and Engineering - Vision inspection system for holograms with mixed patterns

✍ Scribed by Tae-Hyoung Park, ; Hyuk-Joong Kwon,

Book ID: 118164784
Publisher: IEEE
Year: 2010
Weight: 526 KB
Volume: 0
Category: Article
ISBN: 1424454476
DOI: 10.1109/coase.2010.5584721

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