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[IEEE 2010 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR 2010) - Cluj-Napoca, Romania (2010.05.28-2010.05.30)] 2010 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) - Experimental comparation of switching with IGBT and MOSFET

โœ Scribed by Tulbure, A.; Turschner, D.; Abrudean, M.; Ceuca, E.; Ormenisan, R.


Book ID
115472362
Publisher
IEEE
Year
2010
Weight
719 KB
Volume
0
Category
Article
ISBN
1424467241

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