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[IEEE 2010 IEEE International Conference of Electron Devices and Solid- State Circuits (EDSSC) - Hong Kong (2010.12.15-2010.12.17)] 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Design for improved NBTI reliability of CMOS digital IC

✍ Scribed by Liu Lining, ; Li Bin, ; Zhao Mingjian, ; Xie Jiang,

Book ID: 126724651
Publisher: IEEE
Year: 2010
Weight: 472 KB
Category: Article
ISBN: 1424499976
DOI: 10.1109/EDSSC.2010.5713674

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