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[IEEE 2010 IEEE Energy Conversion Congress and Exposition (ECCE) - Atlanta, GA, USA (2010.09.12-2010.09.16)] 2010 IEEE Energy Conversion Congress and Exposition - An investigation into the effects of the gate drive resistance on the losses of the MOSFET-snubber-diode configuration

✍ Scribed by Li, Tin-ho; Wang, Jian-jing; Chung, Henry Shu-hung

No coin nor oath required. For personal study only.

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