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[IEEE 2010 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2010) - West Lafayette, IN (2010.10.17-2010.10.20)] 2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena - On the use of Raman and FTIR spectroscopy for the analysis of silica-based nanofillers

✍ Scribed by Yeung, C; Gherbaz, G; Vaughan, A S

Book ID: 126701823
Publisher: IEEE
Year: 2010
Weight: 444 KB
Category: Article
ISBN: 1424494680
DOI: 10.1109/CEIDP.2010.5723954

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