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[IEEE 2010 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2010) - West Lafayette, IN (2010.10.17-2010.10.20)] 2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena - A new type of controllable multi-spark gap with high reliability applied in high voltage grid

✍ Scribed by Lingdong Xie, ; Jianchao Zheng, ; Yuming Zhao, ; Jisan Yang, ; Jinwei Chu, ; Zhicheng Guan, ; Liming Wang,

Book ID: 124164554
Publisher: IEEE
Year: 2010
Weight: 1022 KB
Category: Article
ISBN: 1424494680
DOI: 10.1109/CEIDP.2010.5724039

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