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[IEEE 2010 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2010) - West Lafayette, IN (2010.10.17-2010.10.20)] 2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena - Simulation of breakdown in small confined volumes inside dielectrics for electrical ageing and diagnostics

✍ Scribed by Pashinin, I; Pancheshnyi, S; Le Roy, Séverine; Pitchford, L C

Book ID: 121655958
Publisher: IEEE
Year: 2010
Weight: 712 KB
Category: Article
ISBN: 1424494680
DOI: 10.1109/CEIDP.2010.5723971

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