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[IEEE 2010 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP 2010) - West Lafayette, IN (2010.10.17-2010.10.20)] 2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena - Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites

✍ Scribed by Sami, A; David, E; Fréchette, M

Book ID: 120078222
Publisher: IEEE
Year: 2010
Weight: 375 KB
Category: Article
ISBN: 1424494680
DOI: 10.1109/CEIDP.2010.5724069

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