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[IEEE 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops) - San Francisco, CA, USA (2010.06.13-2010.06.18)] 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops - Affect valence inference from facial action unit spectrograms

✍ Scribed by McDuff, Daniel; El Kaliouby, Rana; Kassam, Karim; Picard, Rosalind

Book ID: 120007133
Publisher: IEEE
Year: 2010
Weight: 854 KB
Category: Article
ISBN: 1424470293
DOI: 10.1109/CVPRW.2010.5543833

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