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[IEEE 2010 IEEE AUTOTESTCON - Orlando, FL, USA (2010.09.13-2010.09.16)] 2010 IEEE AUTOTESTCON - A verification methodology for prognostic algorithms

โœ Scribed by Zhang, Bin; Tang, Liang; DeCastro, Jonathan; Goebel, Kai


Book ID
120249557
Publisher
IEEE
Year
2010
Weight
894 KB
Category
Article
ISBN
1424479606

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