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[IEEE 2010 IEEE 11th International Conference on Probabilistic Methods Applied to Power Systems (PMAPS) - Singapore, Singapore (2010.06.14-2010.06.17)] 2010 IEEE 11th International Conference on Probabilistic Methods Applied to Power Systems - Sequential short-term reliability evaluation considering repair time distribution

✍ Scribed by Lin Cheng, ; Xiaohui Ye, ; Jian He, ; Yuanzhang Sun,

Book ID: 115508077
Publisher: IEEE
Year: 2010
Weight: 539 KB
Volume: 0
Category: Article
ISBN: 1424457203
DOI: 10.1109/pmaps.2010.5528995

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