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[IEEE 2010 IEEE 10th International Conference on Computer and Information Technology (CIT) - Bradford, United Kingdom (2010.06.29-2010.07.1)] 2010 10th IEEE International Conference on Computer and Information Technology - Towards Estimating Physical Properties of Embedded Systems using Software Quality Metrics

✍ Scribed by Corrêa, Ulisses Brisolara; Lamb, Luis; Carro, Luigi; Brisolara, Lisane; Mattos, Júlio

Book ID: 124096977
Publisher: IEEE
Year: 2010
Weight: 353 KB
Category: Article
ISBN: 1424475473
DOI: 10.1109/CIT.2010.409

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