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[IEEE 2010 IEEE 10th Conference on Nanotechnology (IEEE-NANO) - Ilsan, Gyeonggi-Do, Korea (South) (2010.08.17-2010.08.20)] 10th IEEE International Conference on Nanotechnology - Peak wavelength dependant-localized surface Plasmon Resonance sensitivity

✍ Scribed by Longhua Guo, ; Kim Dong-Hwan,

Book ID: 120217743
Publisher: IEEE
Year: 2010
Weight: 220 KB
Category: Article
ISBN: 1424470331
DOI: 10.1109/NANO.2010.5697749

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