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[IEEE 2010 Fourth International Conference on Secure Software Integration and Reliability Improvement - Singapore, Singapore (2010.06.9-2010.06.11)] 2010 Fourth International Conference on Secure Software Integration and Reliability Improvement - A Decompositional Approach to Automatic Test Case Generation Based on Formal Specifications

✍ Scribed by Liu, Shaoying; Nakajima, Shin

Book ID: 120329123
Publisher: IEEE
Year: 2010
Weight: 446 KB
Category: Article
ISBN: 1424474353
DOI: 10.1109/SSIRI.2010.11

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