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[IEEE 2010 First International Conference on Sensor Device Technologies and Applications (SENSORDEVICES) - Venice, Italy (2010.07.18-2010.07.25)] 2010 First International Conference on Sensor Device Technologies and Applications - Numerical Simulation of Multi-path Ultrasonic Flowmeter: Ultrasonic Path Error Analysis

✍ Scribed by Fei, Liu; Cunfu, He; Bin, Wu; Jingpin, Jiao

Book ID: 121336639
Publisher: IEEE
Year: 2010
Weight: 600 KB
Category: Article
ISBN: 1424474744
DOI: 10.1109/SENSORDEVICES.2010.18

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