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[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Microwire-wound resistors in high value resistance measurements in VNIIM

✍ Scribed by Semenov, Yu.; Samodurov, I.

Book ID: 120210393
Publisher: IEEE
Year: 2010
Weight: 207 KB
Category: Article
ISBN: 1424467950
DOI: 10.1109/CPEM.2010.5544296

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