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[IEEE 2010 Academic Symposium on Optoelectronics Technology (ASOT) - Harbin, China (2010.07.28-2010.08.1)] 2010 Academic Symposium on Optoelectronics and Microelectronics Technology and 10th Chinese-Russian Symposium on Laser Physics and Laser TechnologyOptoelectronics Technology (ASOT) - Seeds optimization algorithm of SIC test sequences in low power BIST

✍ Scribed by Liyi, Xiao; Bei, Cao; Yongsheng, Wang

Book ID: 118260552
Publisher: IEEE
Year: 2010
Weight: 680 KB
Volume: 0
Category: Article
ISBN: 1424455111
DOI: 10.1109/rcslplt.2010.5615313

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