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[IEEE 2010 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS 2010) - Xiamen (2010.01.20-2010.01.23)] 2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems - Framework of MEMS high accelerated stress test

✍ Scribed by Zhen Wang, ; Lixin Xu, ; Zhao Wang, ; Heming Zhao, ; Rongchang Song, ; Wenzhong Lou,

Book ID: 120928566
Publisher: IEEE
Year: 2010
Weight: 380 KB
Category: Article
ISBN: 1424465435
DOI: 10.1109/NEMS.2010.5592211

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