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[IEEE 2010 43rd Hawaii International Conference on System Sciences - Honolulu, Hawaii, USA (2010.01.5-2010.01.8)] 2010 43rd Hawaii International Conference on System Sciences - Combining Phasor Measurements to Monitor Cutset Angles

✍ Scribed by Dobson, Ian; Parashar, Manu; Carter, Chelsea

Book ID: 121827196
Publisher: IEEE
Year: 2010
Weight: 213 KB
Category: Article
ISBN: 142445509X
DOI: 10.1109/HICSS.2010.110

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