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[IEEE 2010 43rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) - Atlanta, GA, USA (2010.12.4-2010.12.8)] 2010 43rd Annual IEEE/ACM International Symposium on Microarchitecture - Sampling Dead Block Prediction for Last-Level Caches

✍ Scribed by Khan, Samira Manabi; Tian, Yingying; Jimenez, Daniel A.

Book ID: 120569158
Publisher: IEEE
Year: 2010
Weight: 675 KB
Category: Article
ISBN: 1424490715
DOI: 10.1109/MICRO.2010.24

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