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[IEEE 2010 3rd International Symposium on Knowledge Acquisition and Modeling (KAM) - Wuhan, China (2010.10.20-2010.10.21)] 2010 Third International Symposium on Knowledge Acquisition and Modeling - The critical success factors for knowledge management adoption - a review study

✍ Scribed by Yen-Ching OuYang, ; Jen-Yin Yeh, ; Te-Chun Lee,

Book ID: 120625109
Publisher: IEEE
Year: 2010
Weight: 299 KB
Category: Article
ISBN: 1424480043
DOI: 10.1109/KAM.2010.5646266

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