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[IEEE 2010 3rd IEEE International Conference on Computer Science and Information Technology (ICCSIT 2010) - Chengdu, China (2010.07.9-2010.07.11)] 2010 3rd International Conference on Computer Science and Information Technology - A novel BIST scheme for low power testing

✍ Scribed by Ye, Bo; Tian-wang Li,

Book ID: 118260499
Publisher: IEEE
Year: 2010
Weight: 794 KB
Volume: 0
Category: Article
ISBN: 1424455375
DOI: 10.1109/iccsit.2010.5563904

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